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An extended abstract of "Metamorphic testing: testing the untestable"
Authors
T.Y. Chen
Sergio Segura
Dave Towey
Zhi Quan Zhou
Publication date
1 January 2019
Publisher
'Institute of Electrical and Electronics Engineers (IEEE)'
Doi
Cite
Abstract
This document is an extended abstract of an IEEE Software paper, "Metamorphic Testing: Testing the Untestable," presented as a J1C2 (Journal publication first, Conference presentation following) at the IEEE Computer Society signature conference on Computers, Software and Applications (COMPSAC 2019), hosted by Marquette University, Milwaukee, Wisconsin, USA. © 2019 IEEE
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idUS. Depósito de Investigación Universidad de Sevilla
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