Pengaruh tingkat kontaminasi permukaan terhadap faktor pindah pada metode tes usap

Abstract

ABSTRACT Monitoring of surface radioactive contamination levels (CL) using a smear test method on a nuclear facility, requires the data of the removal factor (RF) from the surface to the smear paper. If the RF is not always constant, the data of the CL from the smear test method will be wrong. The purpose of this research is to determine the influence of contamination levels on RF values. This research is done by contaminating a P-32 contaminant solution over a 10 x 10 cm2 area of a porcelin surface, and dropping the contaminant of the same amount directly to a plancet as a standard. The smear test is done by wiping a smear paper with circular motion on the contaminated porcelin. The radioactive contaminant attached on the smear paper and the standard are counted by the Geiger Muller detector-. The RF is counted from the ratio between the smear paper counts and the standard counts. On surfaces which have a low total contamination level, or are contaminated with only a P-32 solution, that are not contaminated with other non active chemical substances, for the surface contamination level (CL) = 0,0126.10-3 ,uCi/cm2 to 15,222.10.3 pCi/cm2, RF values range from 20,37% to 36,48%, which are not influenced by the surface contamination level. On the surface with a very low radioactive contamination level that is 0,0056.103 pCi/cm2, RF values are very high. They range from 33,37% to 55,20%, with an average value of 45,7%. On surfaces which have a high total contamination levels, or are contaminated with other non active materials besides the P-32 solution (NaCL in this research), for CL = 5.10-4 gram/cm2 RF = 26,89%-28,42%, for CL = 2.10-3 gram/cm2 RF = 24,65%-29,97%, and for the higher CL = 3.10-3 gram/cm2, RF values decrease to 11,91%- 15,98%