705-713High resolution, low energy X-ray spectroscopy
systems have been developed recently using the Silicon drift detector (SDD)
with in-built Junction field effect transistor (JFET). A comprehensive
simulation study of the SDD and integrated
JFET with a view to formulate the design flow has
been carried out. An optimized process flow for fabrication of SDD and
integrated JFET on high resistivity detector substrate is presented. Based on
these studies, several mask layouts for the SDD,
JFET and reset MOSFET have been designed.
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