X-Ray Fluorescence Spectrometry is now well established as a method for obtaining rapid qualitative and quantitative elemental analysis. Quantitative determinations are made by converting peak intensity into weight percentages of the element by means of proper calibration. Of major imp-ortance is the fact that the samples are not destroyed and the analyses can be performed on solid as well as liquid samples. The study is mainly regarded with the intensity measurements of the characteristic X-radiation at fixed wavelength for the elemental analysis in a sample. The changes in the valence state of a given element can prod-uce shifts in the wavelengths of the characteristic radi- ation. L.G. Parrat resolved a shift of 2.85 XU for the sulphur Ic and K radiations when going from sulphide to sulphate sulphur.Also, the non-proportionality of X-ray Fluorescence intensity vs concentration of sulphur occurs in geological materials prepared as ground samples. Els
hemier and Fabbi have found that samples containing
sulphur as sulphate yield higher intensities than an equi-valent amount of sulphur as the sulphide
