IR and N-IR spectrometry characterizations of LGS crystal and family

Abstract

Middle and near infrared (MIR/NIR) spectrometry has been used to characterize series of samples of LGx family and GaPO4_{4}. Since OH impurities influence the material properties, their spectroscopy is investigated in detail. The [190–3200 nm] region is measured in transmission. Furthermore, the study of spectra made at Nitrogen liquid temperature is used to follow the modification in the signature of some defects present in the lattice and induced by treatments as γ\gamma irradiation or annealing. At least, we show that these “new” materials contain less OH-groups than quartz crystal

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