We describe a novel approach for converting the specimens phase information into strong image contrast
in the x-ray region, the differential interference contrast x-ray microscopy (X-DIC). In the used setup, X-DIC operation
was accomplished by a twin zone plate (TZP), i.e. two zone plates on both sides of the same substrate, laterally
shifted by about one outermost zone width. Once a TZP has been successfully produced by means of especially
developed nanofabrication processes, it is as easy to use as a single zone plate, without any alignment difficulty or
further requirements to the coherence of the illumination. The tremendeous contrast enhancement was demonstrated
at the microscopy beamline ID21 at ESRF in Grenoble for test objects and biological samples. TZPs allow for full
field X-DIC imaging as well as for DIC scanning transmission x-ray microscopy. The first experiments were camed
out at 0.31 nm wave] ength (4 keV photon energy), and features down to approx. 60 nm could be resolved in X-DIC
