Si-O-Si Angle Distribution in Amorphous Silica Characterized by EXAFS Multiple Scattering Calculations

Abstract

EXAFS-Multiple Scattering (MS) calculations has been performed to characterize the second shell of neighbours around silicon in amorphous silica. To render the large Si-O-Si angle distribution, a combination of three regular [(Si(OSi)4] structural models covering the 130 to 160° angle range is used in the calculations