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Interfacial Compatibility in MicroelectronicsMoving Away from the Trial and Error Approach /
Authors
Jorma. Kivilahti
+4Â more
Toni T. Mattila
SpringerLink (Online service)
Markus. Turunen
Vesa. Vuorinen
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X, 218 p.online resource
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Last time updated on 09/04/2020
