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Bauschinger effect in thin metallic films by fem simulations

Abstract

Unpassivated free-standing gold and aluminum thin films (thickness ~ 200-400 nm, mean grain size dm,Au≈ 70-80nm, dm,Al≈ 120-200nm), subjected to tensile tests show Bauschinger effect (BE) during unloading [1, 2]. The focus of this work is to investigate the effect of microstructural heterogeneity such as grain sizes on the BE and the macroscopic deformation behavior in thin metallic films. The finite element code LAGAMINE is used to model the response of films involving sets of grains with different strengths. The numerical results are compared with experimental results from tensile tests on aluminum thin films from the work of Rajagopalan, et al. [2]

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