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Nanoscale electrode processing method based on AFM (atomic force microscopy)
Authors
焦念东
王志迁
董再励
Publication date
12 October 2011
Publisher
Abstract
本发明公开一种基于AFM的纳米级电极加工方法,通过控制AFM探针与样本作用力、探针运动路径及速度对微米级电极进行切割加工,实现电极前端宽度100纳米以内的纳米级电极的加工,增加其在纳流控测试中的检测精度及灵敏度。本发明的纳米级电极加工方法可应用于纳流控芯片中对纳米沟道内流体特性及生物单分子进行高灵敏度检测分析
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Shenyang Institute of Automation,Chinese Academy Of Sciences
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Last time updated on 12/02/2018