We performed measurements of switching current distribution in a submicron
La2−xSrxCuO4 (LSCO) intrinsic Josephson junction (IJJ) stack in a
wide temperature range. The escape rate saturates below approximately 2\,K,
indicating that the escape event is dominated by a macroscopic quantum
tunneling (MQT) process with a crossover temperature T∗≈2K. We
applied the theory of MQT for IJJ stacks, taking into account dissipation and
the phase re-trapping effect in the LSCO IJJ stack. The theory is in good
agreement with the experiment both in the MQT and in the thermal activation
regimes.Comment: 9 pages, 7 figure