We have developed a new method to fabricate biepitaxial YBa2Cu3O(7-x) (YBCO)
Josephson junctions at the nanoscale, allowing junctions widths down to 100 nm
and simultaneously avoiding the typical damage in grain boundary interfaces due
to conventional patterning procedures. By using the competition between the
superconducting YBCO and the insulating Y2BaCuO5 phases during film growth, we
formed nanometer sized grain boundary junctions in the insulating Y2BaCuO5
matrix as confirmed by high resolution transmission electron microscopy.
Electrical transport measurements give clear indications that we are close to
probing the intrinsic properties of the grain boundaries.Comment: 16 pages, 6 figure