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Electrical stability impact of gate oxide in channel implanted SiC NMOS and PMOS transistors
Authors
Chan H-K
Clark DT
+8Â more
Horsfall AB
Idris MI
Murphy AE
Ramsay EP
Smith DA
Weng MH
Wright NG
Young RAR
Publication date
1 January 2017
Publisher
Trans Tech Publications Ltd
Abstract
Abstract is not available.
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Newcastle University E-Prints
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Last time updated on 30/05/2021