Es-Souni, M.

Gholinia, A.

Goran, D.

Habouti, S.

Lahmar, A.

Solterbeck, C. H.

The study aims to show the capability of the "Nordlys S" high resolution Electron Backscatter Diffraction (EBSD) detector and CHANNEL5 software to successfully analyse materials in thin films with rhombohedral crystal structures as the Bismuth Iron Oxide, BiFeO3 (BFO). The texture and microstructure of pure BFO and LaMnO3 (LM) doped BFO thin films were analyzed by EBSD. The results indicate that the LM doped BFO thin films are characterized by different microstructural and textural features compared to the pure BFO thin film. It was also experimentally found that the pure BFO and the LM doped BFO thin films have very different electric properties. The high resolution of the "Nordlys 5" EBSD detector was successfully used to solve the pseudosymmetry problems of the BFO phase. The EBSD technique is a powerful tool that can be used to study the influence of texture and microstructure on the functional properties of BFO thin films.</p

Texture and microstructure of bismuth iron oxide thin films analyzed by EBSD

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