Work supported in part by the Central Research Project 01.08.B.Zadanie pt. „Digitalizacja i udostępnienie w Cyfrowym Repozytorium Uniwersytetu Łódzkiego kolekcji czasopism naukowych wydawanych przez Uniwersytet Łódzki” nr 885/P-DUN/2014 zostało dofinansowane ze środków MNiSW w ramach działalności upowszechniającej naukę

Iskhakov, R. S.

Maksymowicz, L. J.

Temple, D.

Żuberek, R.

English

Repozytorium Uniwersytetu Łódzkiego (University of Lodz Repository)

Acta Physicae Superficierum • Vol I • 1990DEPENDENCE OF THE SWR LINEWIDTH ON THE WAVEVECTOR IN AMORPHOUS THIN FILMS*L. J. M AKSYM OW ICZ, R. S. ISKHAKOV*, D. TEM PLE A N D  R. ŻUBEREKDepartment od Physics and Electron Technology, Institute of Electronics,Academy of M ining and Metallurgy, 30-059 Kraków, PolandA bstract . The linewidth of volume Spin Wave Resonance (SWR) modes in FeB metallic glasses have been studied at X-band frequencies for temperatures ranging from 4 К to 295 К  in perpendicular configuration. It was found that fluctuations in the exchange interaction parameter of the spin system in amorphous state affects the linewidth A H , of the л-th mode. For wavevectors кщ above a critical value, the linewidth AH n~k°n 1±0> and does not depend on the temperature.1. INTRO DUCTIO NThere are several models of amorphous structures that can be applied for metallic glasses. The hard spheres model [1] assumes that some empty space exists, a so called free volume, acting as vacancy-like defects and enabling reorientation of atom pairs. In the simple chemical twinning model [2] frustration and concentration fluctuations are considered as the source of disorder. The microcrystallite model [3] considers ordering of crystallite-like clusters.Topological disorder in amorphous substances must lead to some spatial fluctuations of local structural and magnetic parameters [4]. In a phenomenological approach, the fluctuations of a parameter are described by static moments of stochastic functions: the mean value of the parameter, the amplitude of the fluctuations a and the correlation length £. We expect the correlation length perhaps of several interatomic distance in amorphous materials and so suitable experimental techniques must be applied to sense the effects on this micro scale.* Work supported in part by the Central Research Project 01.08.B.+ USSR Academy of Sciences, Physics Institute Krasnoyarsk, USSR.+ + Institute of Physics, Polish Academy of Sciences, 02-668 Warszawa, Poland.Therefore, it is rather in a limit of greater kH vectors that we may observe the fluctuations. Ignatchenko et al. [5, 6] suggested an SWR experiment. Their phenomenological model assumes long range fluctuations of the saturation M, exchange constant and anisotropy field. Each of the fluctuations alters the quadratic dispersion relation for crystalline phases in a characteristic way. Therefore, we may extract information from experiment on the fluctuation parameters such as a and  ^ and also may indicate which mechanism is predominated. Such an experiment on FeB amorphous thin films was presented in our earlier paper [7].2. M ODELWe assume that the spin system in ferromagnetic materials can be described by the Hamiltonianwhere a is the exchange integral, M  the magnetization, ß the uniaxial anisotropy constant with easy axis in the /-direction, H  the external magnetic field and Hm is the demagnetization field.If, for example, the exchange integral a. (r) is a stochastic function of the space coordinates r  with mean value a and standard deviation from the average a, then the dispersion relation w(k) is given by [6]whereL (k)—(&)—oj0)/ya. M  — k 1. (3)F or crystalline ferromagnet, when <r=0, one gets L(k) = 0 from eq. (2) and then we recover from eq. (3) the standard quadratic dispersion relation w=a)0 + ya.Mk2, where ш0 is the spin wave frequency for the uniform mode k = 0. For systems where er^O, such as in amorphous state, we must perform integration in eq. (2) for an assumed form of the Fourier transform S ( k —k') of the normalized correlation function К  (r — r'). The model correlation function was chosen [6] in the form of the Karman functionK (r)=( 1 + r /f le - '« , (4)where £ is the correlation length associated with the correlation wave vector ka (of quantity a, here the exchange integral),кя= Щ .  (5)Carrying out the integration in eq. (2) we get the dispersion relation in the limiting cases of small and large wavevectors:a >  =  c t ) 0  + ya.M ( 1  — -3 <т2) /с 2 , for k < k a, (6)w = co0 + y o t M ( l - ^ a 2)k 2+Ąl(T2kl,  for kt>ka. (7)It is seen that a> ~ k 2 as in the crystalline state ct =  0 but the slope of the predicted straight line on the plot of w vs k2 is smaller. Moreover, the slope is different for small and large к and we also expect a kink or a deflection at k = k a.a. b.c. d.Fig. 1. Dispersion relation of the spin waves for amorphous ferromagnet with predominant spatial fluctuations, а ф  0, of: (a) exchange integral a; (b) the magnetization M ; (c) the direction / o f the easy axis, and (d) the anisotropy constant ß; all after ref. [6 ] . Dashed lines are for crystalline state when a = 0 .Figure la  presents a schematic plot of the dispersion relation со as a function of к2 for the case of fluctuations of the exchange integral a. Figure lb-d illustrates the effect of fluctuations of other parameters in the Hamiltonian (1): the magnetization M  and anisotropy direction I or its strength ß .  Figure 1 was taken after ref. [6].We often think of the dispersion relation as a function со (к ) with no imaginary part. This is so for systems with perfect translational symmetry as in the crystalline state where there is no spin wave energy dissipation due to the scatterings on inhomogeneities of the fluctuating magnetic parameter. If, however, аФ 0 then some energy losses take place which manifest themselves by the fact that Im (к )  Ф  0 leading to a finite spin wave mode linewidth given by [8]A H , = — o2f{k a, k)where D is the spin wave stiffness constant, g the Lande factor and f ( k a, k) a function of spin wavevector k.We studied thin amorphous films of Fe47B J3 alloys obtained by rf sputtering technique using a mosaic target. The films were deposited onto glass substrates Corning 7059 at room temperature. The distance between the target and the substrate was 45 mm. The film composition was determined by means of X-ray microprobe analysis with accuracy of 2%. A Talysurf instrument was used to measure the thickness of the samples with accuracy of 50 A. The amorphous structure of the films was confirmed by transmission electron spectroscopy and also by X-ray diffraction.Spin wave resonance spectra for perpendicular configuration were taken with a microwave X-band spectrometer for temperatures from 4 К to 295 K. Only samples with at least 11 peaks were selected for the study to cover a wide range of spin wavevectors к up to some values above ka. (This is essential to observe the influence of the long range fluctuations of the magnetic parameters in amorphous films.)In our earlier work [7] the dispersion relation for SWR spectra consisting of 14 volume modes was measured indicating clear deviation from the quadratic law due to the fluctuations of the exchange integral oc. In another paper [9] we also measured the SWR linewidth AHn against the wavevector k, for k > k a, and for different temperatures. In general, there are several mechanisms found to be responsible for the dependence of АНЯ on the wavevector к [ 10,11] : variations in magnitude of the magnetization M across the film or variation of the thickness L (yielding AHM~ k z), eddy current damping or strain variations (giving AHE~ k ~ 2) [11, 12], or spin-spin interactions (with AHa~k).  Here we assume a power lawwhere n is the mode number and we assume a simplified relation between к and n for a film of thickness L,3. EXPERIMENT4. RESULTS AN D  DISCUSSIONAH„~k (9)(10)Figure 2a-c shows the n dependence of AHn in a logarithmic scale for Fe47B53 thin films for three temperatures [13]. It is seen that there is no significantn dependence of the linewidth up to some particular value of n. For k > k a=nn/L  we have nm where m is about 0.8. The inflection of the curve takes place at the same value ka as that obtained in paper [7] for the inflection of the dispersion relation caused by exchange integral fluctuations. We also observed that neither m nor k„ depends on the temperature T.Fig. 2. Dependence of the linewidth A H , on the mode number n for amorphous i e47B5 5 films fordifferent temperatures T.We conclude that the long range fluctuation of the exchange parameter a influences the magnon scattering in the SWR experiment. This is well apparent in the AHH vs к data. Unfortunately, there is no theory of these scattering processes in amorphous substances so that we are unable to make a comparison with a theoretical model. We hope to produce some calculations in that direction later on.ACKNOW LEDGEM ENTSThe authors wish to thank J. Sokulski M.Sc. for preparing the films and Dr. V. A. Ignatchenko for useful discussions.REFERENCES1. F. Rettenmcier and H. Kronmuller, Phys. Stat. Sol., A93 (1986) 221.2. J. M. Dubois, P. H. Gaskell and G. Le Caer, Rapidly Quenched M etals, Elsevier Science Publishers, (1985) 567.3. J. Zweck and H. Hoffman, J. M agn. Magn. M at., 45 (1984) 382.4. C. G. Montgomery, J. I. Krugler and R. M. Stubbs, Phys. Rev. Lett., 25 (1970) 669.5. V. A. Ignatchenko and R. S. Iskhakov, Zh. Eksp. Teor. Fiz., 72 (1977) 1005.6. V. A. Ignatchenko and R. S. Iskhakov, Proc. 2nd Intern. Conf. Physics o f  M agnetic Materials, Jadwisin, Poland (1984).7. L. J. Maksymowicz, D. Sendorek-Temple and R. Źuberek, J. Magn. Magn. M at., 58 (1986) 303.8. V. A. Ignatchenko and R. S. Ishakov, Preprint N o. 268 F, Inst, of Phys., Ac. Sei. USSR, Krasnoyarsk (1985).9. L. J. Maksymowicz, D. Temple and R. Żuberek, J . Magn. M agn. M at., 62 (1986) 305.10. T. G. Phillips and H. M. Rosenberg, Phys. Lett., 8 (1964) 298.11. I. G. Cullis and M. Heath, J. Phys., F10 (1980) 309.12. T. G. Phillips and H. M. Rosenberg, Proc. Int. Conf. Magnetism, Nottingham, p. 306.13. R. S. Ishakov, L. J. Maksymowicz, D. Temple and R. Żuberek, Proc. Symp. on M agnetic Properties o f  Amorphous M etals, Benalmadena, Spain, 26-29 May 1987.

Dependence of the SWR Linewidth on the Wavevector in Amorphous Thin Films

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Dependence of the SWR Linewidth on the Wavevector in Amorphous Thin Films

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