On the SiC(0001) surface (the silicon face of SiC), epitaxial graphene is
obtained by sublimation of Si from the substrate. The graphene film is
separated from the bulk by a carbon-rich interface layer (hereafter called the
buffer layer) which in part covalently binds to the substrate. Its structural
and electronic properties are currently under debate. In the present work we
report scanning tunneling microscopy (STM) studies of the buffer layer and of
quasi-free-standing monolayer graphene (QFMLG) that is obtained by decoupling
the buffer layer from the SiC(0001) substrate by means of hydrogen
intercalation. Atomic resolution STM images of the buffer layer reveal that,
within the periodic structural corrugation of this interfacial layer, the
arrangement of atoms is topologically identical to that of graphene. After
hydrogen intercalation, we show that the resulting QFMLG is relieved from the
periodic corrugation and presents no detectable defect sites