We show that Joule heating causes current-controlled negative differential
resistance (CC-NDR) in TiO2 by constructing an analytical model of the
voltage-current V(I) characteristic based on polaronic transport for Ohm's Law
and Newton's Law of Cooling, and fitting this model to experimental data. This
threshold switching is the 'soft breakdown' observed during electroforming of
TiO2 and other transition-metal-oxide based memristors, as well as a precursor
to 'ON' or 'SET' switching of unipolar memristors from their high to their low
resistance states. The shape of the V(I) curve is a sensitive indicator of the
nature of the polaronic conduction.Comment: 13 pages, 2 figure