In this paper, a four-point characterization method is developed for
resistive samples connected to either resistive or capacitive contacts.
Provided the circuit equivalent of the complete measurement system is known
including coaxial cable and connector capacitances as well as source output and
amplifier input impedances, a frequency range and capacitive scaling factor can
be determined, whereby four-point characterization can be performed. The
technique is demonstrated with a discrete element test sample over a wide
frequency range using lock-in measurement techniques from 1 Hz - 100 kHz. The
data fit well with a circuit simulation of the entire measurement system. A
high impedance preamplifier input stage gives best results, since lock-in input
impedances may differ from manufacturer specifications. The analysis presented
here establishes the utility of capacitive contacts for four-point
characterizations at low frequency.Comment: 21 pages, 10 figure
