Surface-sensitive ion beam techniques, such as Secondary Ion Mass Spectrometry (SIMS) and Low-Energy Ion Scattering (LEIS), are making significant contributions to further our understanding of the materials’ performance and the degradation processes that occur under operating conditions. In this contribution, we explore how recent instrumental developments and analytical approaches have boosted the application of these powerful techniques for the characterization of surfaces and interfaces in energy conversion and storage devices.Universidad de Málaga. Campus de Excelencia Internacional Andalucía Tech
