Applying focused ion beam (FIB) nanotomography and Rutherford backscattering
spectroscopy (RBS) to dealloyed platinum-aluminum thin films an in-depth
analysis of the dominating physical mechanisms of porosity formation during the
dealloying process is performed. The dynamical porosity formation due to the
dissolution of the less noble aluminum in the alloy is treated as result of a
reaction-diffusion system. The RBS analysis yields that the porosity formation
is mainly caused by a linearly propagating diffusion front, i.e. the
liquid/solid interface, with a uniform speed of 42(3) nm/s when using a 4M
aqueous NaOH solution at room temperature. The experimentally observed front
evolution is captured by the normal diffusive
Fisher-Kolmogorov-Petrovskii-Piskounov (FKPP) equation and can be interpreted
as a branching random walk phenomenon. The etching front produces a gradual
porosity with an enhanced porosity in the surface-near regions of the thin film
due to prolonged exposure of the alloy to the alkaline solution.Comment: 4 pages, 5 figure