We demonstrate thin-film metamaterials with resonances in the mid-infrared
wavelength range. Our structures are numerically modeled and experimentally
characterized by reflection and angularly-resolved thermal emission
spectroscopy. We demonstrate strong and controllable absorption resonances
across the mid-infrared wavelength range. In addition, the polarized thermal
emission from these samples is shown to be highly selective and largely
independent of emission angles from normal to 45 degrees. Experimental results
are compared to numerical models with excellent agreement. Such structures hold
promise for large-area, low-cost metamaterial coatings for control of gray- or
black-body thermal signatures, as well as for possible mid-IR sensing
applications.Comment: The following article has been submitted to Appl. Phys. Lett. After
it is published, it will be found at http://apl.aip.org/. 14 pages including
4 figure page