HAGA Akira

KAWAMATA Ken

MINEGISHI Shigeki

SATO Risaburo

English

川又, 憲

3467

カワマタ, ケン

KAWAMATA, Ken

嶺岸, 茂樹

3588

ミネギシ, シゲキ

MINEGISHI, Shigeki

芳賀, 昭

3468

ハガ, アキラ

HAGA, Akira

佐藤, 利三郎

3469

サトウ, リサブロウ

SATO, Risaburo

Hachinohe Institute of Technology Repository / 八戸工業大学学術リポジトリ

A ⅣIeasurement ttlethod of Fast Voltage Rise Curves dueto Gap]Discharge l」sin  Coupled Trans■lission Lines inE)istributed Constant Line SystemKen KAWAMATA*Shigekiよ/11NEGISHI**Akira HAGA**and Risaburo SATOキAbstractThe measurement rnethod of very fast voltage transients due to gap discharge using coupledtrans■lission lines、vas exa■lined to lind the pure voltage rise curves  The measurement systemconsists of the distributed constant line system,because the voltage transients were very rapidA characteristic of the gap electrode, which has a matched impedance for the distributedconstant syste■1,郡ras investigated in the frequency range below 5 GHz  The voltage of pOwersource in experirnent 、as 510ヽ「 and 800ヽ「 because the Paschen's iaw holds stability in aircondition  As a consequence of the experirnent using this measurement systen■,the measure‐ment rnethod made it possible to obsepre the rise tirne of about 100 ps  lt Ⅵ′as conFirmed thatthe rneasurement rnethod enables to measure the high speed and high voltage rise curves out ofcontact郡ァi h the lnain circuit  And so,the voltage rise tilnes都ァer aried in accordance with thevoltage′【t,コ砂οrゴs: measurent rnethod,voltage rise curve,coupled transmission linesI. INTRODUCTIONIt is、vell kno耶〆n that the sudden voltage transients are generated at the make and breakof electrical contacts and surrounding electrical devices are arected.  The discharge at thecontacts should be considered as a main factor of the electromagnetic noise sourcel)'2).S覇/itching noise has been studied extensively, but in allnost aH reports, phenomena at theelectric contacts have been investigated froni the vie耶〆point Of the con act r hability and thecontact materials3)～8)The voltage transients are considered from ttie覇〆poi t of tilne doma n as EWII source at themaking of electrical contacts  Ho、vever,As the transients M〆ere v ry rapid and nuctuation、vascomphcated, it was dimcult to nnd the factors of the transients due to discharge on lumpedconstant syste■19)'10).A measurement system of very fast voltage rise curve using coupled trans■lission lines、vasexamined to lind the pure voltage transients  A characteristic of the gap electrode,、vhich hasa matched impedance for the distributed constant systenl,、vas investigated in the frequencyrange beloM/5 GHz.  The voltage of poⅥrer s urce in experilnent、vas 510ヽ「and 800 V because平成 8年10月18日受理* HachinOhe lnst of Tech**Tohoku Gakuin Univ-61-

A Measurement Method of Fast Voltage Rise Curves due to Gap Discharge Using Coupled Transmission Lines in Distributed Constant Line System

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A Measurement Method of Fast Voltage Rise Curves due to Gap Discharge Using Coupled Transmission Lines in Distributed Constant Line System

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Hachinohe Institute of Technology Repository / 八戸工業大学学術リポジトリ