We have numerically implemented a perturbation series for the scattered
electromagnetic fields above rough surfaces, due to Greffet, allowing us to
evaluate the local density of states to second order in the surface profile
function. We present typical results for thermal near fields of surfaces with
regular nanostructures, investigating the relative magnitude of the
contributions appearing in successive orders. The method is then employed for
estimating the resolution limit of an idealized Near-Field Scanning Thermal
Microscope (NSThM).Comment: 10 pages, 7 figure