'Institute of Electrical and Electronics Engineers (IEEE)'
Doi
Abstract
Static linked faults are considered an interesting class of memory faults. Their capability of influencing the behavior of other faults causes the hiding of the fault effect and makes test algorithm design a very complex task. A large number of March tests with different fault coverage have been published and some methodologies have been presented to automatically generate March tests. In this paper we present an approach to automatically generate March tests for static linked faults. The proposed approach generates better test algorithms then previous, by reducing the test lengt
