The Complemented System Approach: A Novel Method for Calculating the X-ray Scattering from Computer Simulations

Abstract

In this paper, we review the main problem concerning the calculation of X-ray scattering of simulated model systems, namely their finite size. A novel method based on the Rayleigh-Debye-Gans approximation was derived, which allows sidestepping this issue by complementing the missing surroundings of each particle with an average image of the system. The method was designed to operate directly on particle configurations without an intermediate step (e.g., calculation of pair distribution functions): in this way, all information contained in the configurations was preserved. A comparison of the results against those of other known methods showed that the new method combined several favourable properties: an arbitrary q-scale, scattering curves free of truncation artifacts and good behaviour down to the theoretical lower limit of the q-scale. A test of computational efficiency was also performed to establish a relative scale between the speeds of all known methods: the reciprocal lattice approach, the brute force method, the Fourier transform approach and the newly presented complemented system approach.Comment: 6 pages, 5 figures. Copyright 2010 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in The Journal of Chemical Physics and may be found at http://link.aip.org/link/?jcp/133/17412