The giant piezoresistance (PZR) previously reported in silicon nanowires is
experimentally investigated in a large number of surface depleted silicon nano-
and micro-structures. The resistance is shown to vary strongly with time due to
electron and hole trapping at the sample surfaces. Importantly, this time
varying resistance manifests itself as an apparent giant PZR identical to that
reported elsewhere. By modulating the applied stress in time, the true PZR of
the structures is found to be comparable with that of bulk silicon