How fast do Chinese firms learn and catch up? Evidence from patent citations
- Authors
- A Amsden
- A Arora
- A Arora
- A Arora
- A Gerschenkron
- A Jaffe
- A Mehta
- AB Jaffe
- B Kogut
- B-W Lin
- BH Hall
- BL Simonin
- C Lecocq
- C Perez
- CJ Dahlman
- D Chatterji
- D Ernst
- D Teece
- DA Belsley
- DA Levinthal
- DC Mowery
- DJ Teece
- DKN Johnson
- E Hippel von
- E Horwitz
- E Mansfield
- EH Kessler
- G Ahuja
- G Hofstede
- H Chesbrough
- H Martinez
- HS Chawla
- J Hagedoorn
- J Hagedoorn
- J Ying-Li
- JA Hausman
- JA Mathews
- JA Schumpeter
- JL Cummings
- JM Utterback
- K Lee
- K Lee
- K-H Tsai
- KJ Arrow
- L Fleming
- L Kim
- L Kim
- L Kim
- L Kim
- L Marengo
- LK Mytelka
- LL Blodgett
- M Bell
- M Bell
- M Cloodt
- M Dodgson
- M Hobday
- M Trajtenberg
- N Kumar
- Nadine Roijakkers
- O Kravdal
- P Almeida
- PC Grindley
- PM Senge
- R Vernon
- RH Pitkethly
- RK Kazanjian
- S Lall
- S Lee
- S Yayavaram
- S-L Jang
- U Lichtenthaler
- W Vanhaverbeke
- Wim Vanhaverbeke
- WM Cohen
- WM Cohen
- X Liu
- Yuandi Wang
- Publication date
- Publisher
- 'Springer Science and Business Media LLC'
- Doi