Rang, Toomas

English

Periodica Polytechnica (Budapest University of Technology and Economics)

COMPUTER-AIDED EXAMINATION OF THE fJ-L CURRENT SOURCE AND OF THE BEHAVIOUR OF THE iL FLIP-FLOP USED IN STATIC MEMORY CELLS By T. RAr-:G* Tall,in Polytechnicai Institutc_ Estonia. LSSR Received February 27. 1981 Presented by Prof. Or. K. T.-'.R:-;A Y Two types of bandgap current reference circuits have bee:p. presented by Bruun and Hansen [lJ, such as the circuit using current mirror technique and the feedback arrangement. For the circuit using the current mirror technique they have determined the temperature dependence of the reference current of the circuit. For the feedback circuit the same dependence has been calculated by us with the non-linear circuit analysis program TRANZ-TRAN [2]. The feedback circuit is shown in Fig. 1. The transistors Ql- Q3 are conventional non integrated transistors. The transistor Q4 is the lateral transistor (lateral part) of the 12 L gate. F or this transistor the lateral part of our L gate model, described in [3]. has been used. At first the influence of some circuit parameters on the reference current got calculated. Calculations show the reference current and the slope of the curve of reference current not to depend on transistor Q 1 - Q3 current gain f3 and also the other transistor parameters not to be critical. Therefore it is quite easy to build up this band gap reference circuit using feedback arrangement. 12L injectors Fig. I. The bandgap current reference circuit using feedback arrangement * Thescs madc at thc Dcpartment of Electronic Dc\ices. Technical Lni\ersity Budapest 160 T. RAse Also the effect of the load current (1 d on the reference current (ireJ) has been investigated. As the calculations have shown, with the change of] i the slope of the curve of the reference current could be changed. The smaller ]1 the smaller the slope of the curve of the reference current. Dependence of the reference current- on saturation current of the transistor Q4 is seen in Fig. 2. These results ao-70-lcc 60-50-L£)-30-20c 10 0 Q80 082 0.84 0.86 0.88 0.99 Fig. 2. The reference current dependence on saturation current of transistor Q4 (injector transistor of the J 2 L gate) are quite important from the point of view of technology of the ]2 L gates. A greater] 0' resulting from lower epilayer concentration and smaller lateral base thickness, is seen to quicker reference current saturation. than a smaller 10 , In other words. the saturation level of the reference current is reached at a lower voltage, when in the (2 L gate the saturation current of the lateral part is greater. Also remind that 10 determines] ;nj to be calculated as 1 ;nj = 1 reJ . l:' Igure 3 shows the temperature dependence of Ire)' calculated curves from feedback arrangement and measured curves from the circuit using current mirror technique seem to be in a good agreement. This shows these two circuit solutions to be practically equivalent. Our flip-flop model based on the model of the 12 L gate has been described elsewhere [3]. The behaviour of such a type of flip-flop, often used in static memory cells (see e.g. [4J), was examined at different temperatures with the nonlinear circuit analysis program TRANZ-TRAN [2]. The investigations referred to d.c. and dynamic behaviour. Figure 4 shows the scheme of the ]2 L flip-flop. The inputs of the flip-flop are the injectors of the 12 L gate and the outputs are the collectors of the vertical npn uAJ BO 60 40 20 o o I I _i~ E.LI.\f}SATlOS Of }'L CL RRE.\7 SOLRCL :. I •••• ij' ij' jj' ii j' ji Ta "-10,( Ta" 25'C 2 ---- calculat ed , measured 3 5 Fig, 3. The reference current dependence on temperature I \;>< i T -' 12 L 12 L 1 Fig. 4. Schematic figure of the J2 L flip-flop !--161 WL 162 T. RANG ~n ':j ~ 2D1 1nll U1 :1 01 t I 0 240 480 720 960 1200 1440 1600 [ns] a) EXAM/NAT/OS Of I'L CCRRENT SOLRCE 163 [~j Lb,UQ l Q9 I OB UQ I 0.7 I I 0.6~ 0.5j 1. T= 50'C ! 0.4~ 2. T= 25°C 031 3. T 100'( Q~ 4. T= 175'C I j i UQ J 0.11 I I I 0 i-0 120 240 360 480 600 720 800 900 10801200130014401560 1680 ~ns= Ci ! 0.6~ I 0 5J • I 1. 9 = 0 1014 neutron --,-m-Oh~ 2. rp =10 15 03 021 4 rp= 10 17 neut;9.!!.. 0.1 ~ j, \r--____ m_--1' 0, , tlUU t ! o 120 240 360 480 600 720 840 960 10801200 132014401560 1680 [nsJ d) Fig. 5. The temperature and neutron irradiation dependence of the dynamic behaviour of the jCL flip-flop: a .. driving impulses: b .. minority carrier lifetime omitting temperature effect: c .. minority carrier lifetime reckoning with temperature; d .. reckoning with irradiation 164 T. RAse part of the ]2 L gate. The W L line is supposed to be on the ground potential. The increase of the temperature is to accelerate the turnover of the flip-flop. The transfer characteristic temperature dependence of the ]2 L gate has been reported in [S] and has been shown. that the gate turns over earlier if the temperature increases, and that at very high temperatures (T ~ 175 CC) the high voltage state of the ]2 L gate disappears a quite noticeable phenomenon. Flip-flop is seen to loose its high voltage state (about 0.15 V), but the strong effect observed for a single gate, here does not exist. Namely the gates, connected crosswise. compensate for the temperature influence. The neutron irradiation has very similar influence to transfer surface of the flip-flop. The increase of the neutron irradiation cancels the low voltage stage of ]2 L flip-flop. In case of the strong neutron flux <P ~ 1017 neutron/m 2 only the high output level is seen. which means, that the flip-flop could not work. Figure 5 shows the dynamic response of the {2 L Dip-flop at different temperatures. Fig. Sa presents the driving impulses and Figs 5b-5d the calculation results. Fig. 5b ignores the temperature dependence of minority carrier lifetime. but in Fig. 5c this effect is taken into account. Temperature dependence of the minority carrier lifetime is seen to have a strong influence on the dynamic behaviour of the flip-flop. Omission of the temperature dependences distorts the true picture of the turn-over process. Fig. 5b shows the temperature increase to accelerate the turnover which is true at constant lifetime. The temperature increase is known to increase the lifetime, increasing in turn. one of the important model parameters the diffusion capacitance. Physicaliy it means. that for the charge remove more time is needed. i~Jso the high voltage state was found to decrease with increasing temperature. This behaviour is very similar to that observed in examining the ring-oscillator [6]. The increase of neutron irradiation (Fig. 5d) causes the low output level to disappear. The following conclusions were arrived at: 1. The two types of band gap current references. published in literature [1]. are practically equivalent. 2. The reference current depends on saturation current of transistor Q4. lateral (injector) part of ]2 L gate. 3. The slope of the curve of the reference current depends on the value of the load current (/1 J. 4. The reference current is practically independent of the feedback circuit transistor parameters. 5. The flip-flop is able to work in a very wide range of temperature. is valid both for d.c. and dynamic behaviour. In examining the dynamic behaviour of the flip-flop the temperature dependence of the minority L\.HII.\ A 710 \ Of I'/. Cl RRE.\7 SOl ReI 165 earner lifetime has to be taken into account because this parameter has a strong effect on the turn-over process. 6. The neutron irradiation has a very strong influence in 12 L flip-flop. A flux over 10 16 neutron/m 2 causes failure of the flip-flop. Acknowledgement The author would thank professor Kalman Tarnay. head of the Department of Electronic Devices. Technical Cniversity Budapest. for his useful ad vices in preparing this article. Summary A band gap CUirent reference circuit. described [I] has been analysed with the non-linear circuit analysis progiam TRA:'-lZ-TRA:'-l. Originally the circuit has been develop-;;d for two different injector current regions and used to control the injector current of /2 L circuits for supply volt ages down to about 1 V. The tv;o circuits have been shown to be equal from the point of view of reference current. Also the effect of some circuit parameters on reference CUirent and the dependence of the reference current on lateral current of the /2 L gate have been investigated. The model of /2 L llip-llop has been built up from models of the single /' L gate. Investigations of the temperatUie and neutron irradiation dependence of the transfer surface and of the dynamic behaviour of the /2 L llip-llop showed. that the /' L !lip-llop preserved the working ability in a wide range of the temperatUies for d.c. and for dynamic regions. Also calculations show. that in dynamic examinations it is very important to take the temperature dependence of the minority carrier lifetime into account. The increase of neutron irradiation causes the two level performances of the /2 L llip-flop to disappear. References L BRLl':'. E. H:\:\SE~. 0.: Lo\'. \oltag~ operation of j:L circuits. Papers for 19SfJ ISSCC. paper IO{)6. :2. T.-\R:\.·\Y. K. SZl:KELY V.' A TRA~Z-TRA:\ nonlint:ar circuit anuiysis progran1. Hirad{lsicchnika. XXIV. j9:~. 25: (in Hungarian). .. RA~C;. T .. ivl\.1dcilinf or th~ r:·L g::k b:: n1can:-. or th..: TRA::\Z-TRA~ nonlincar circuit anal:::--ing progElnl. Hirad{J.:,tcchnika. XXXi. 19~,(J. :2 1 (-, (in Hungarian 1. .+. BEREZ1\:. A. S. LAP'sHl\:SK Y. V. A."" O~ISCH·CtlE~KU. E. M. SH:\(1LRI:\. L 1.: The injection n1eTI10f} cell. M ikroekktronika. '. 19/X. ! 26 (in Russian). , R,,:-;c;. T.: The d.e. modeling of j=L gate with the nonlinear circuit analysis program TRA;\Z-TRA;\. Periodica Po\technica El. Eng. Vol. 2S. p. 103. (In I) 6. RA:-;c;. T. LiKSEI. B.: The propagation delay time dependence on temperature and neutron irradiati()n in !=L gates. Men~s cs Automatika (to he published) lin Hungarian). dr. Toomas RA:'-lG. Tallin Poly technical Institute. Estonia. USSR Tallin 200026. Ehitajate tee 5 Chair of Electronics 

COMPUTER-AIDED EXAMINATION OF THE I2L CURRENT SOURCE AND OF THE BEHAVIOUR OF THE I2L FLIP-FLOP USED IN STATIC MEMORY CELLS

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COMPUTER-AIDED EXAMINATION OF THE I2L CURRENT SOURCE AND OF THE BEHAVIOUR OF THE I2L FLIP-FLOP USED IN STATIC MEMORY CELLS

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Periodica Polytechnica (Budapest University of Technology and Economics)