Significant efforts of the test design community have addressed the development of high
level test generation algorithms in the last decade. The main problem originates in the
insufficiently low gate level fault coverage of test sets generated at the behavioural or
functional levels due to oversimplifications which result from the application of highly
abstract and technology-independent fault models.
In this paper a novel behavioural level test generation algorithm is presented effectively
utilizing information on the circuit structure, which is extracted from the high level
synthesis process.
Experimental results show that the gate level fault coverage of the test sets generated
by the new algorithm is similar to those assured by the gate level test generation
algorithms
