The far-field angular response pattern for dipole antenna-coupled infrared detectors is investigated. These devices utilize an asymmetric metal-oxide-metal diode that is capable of rectifying infrared-frequency antenna currents without applied bias. Devices are fabricated on both planar and hemispherical lens substrates. Measurements indicate that the angular response can be tailored by the thickness of the electrical isolation standoff layer on which the detector is fabricated and/or the inclusion of a ground plane. Electromagnetic simulations and analytical expressions show excellent agreement with the measured results
