Daniel W. Koon

Dirch Hjorth Petersen

Ehrstein J. R.

Fei Wang

Menzel P.

Ole Hansen

van der Pauw L. J.

We derive exact, analytic expressions for the sensitivity of resistive and Hall measurements to local inhomogeneities in a specimen's material properties in the combined linear limit of a weak perturbation over an infinitesimal area in a small magnetic field. We apply these expressions both to four-point probe measurements on an infinite plane and to symmetric, circular van der Pauw discs, obtaining functions consistent with published results. These new expressions speed up calculation of the sensitivity for a specimen of arbitrary shape to little more than the solution of two Laplace equation boundary-value problems of the order of N3 calculations, rather than N2 problems of total order N5, and in a few cases produces an analytic expression for the sensitivity. These functions provide an intuitive, visual explanation of how, for example, measurements can predict the wrong carrier type in n-type ZnO.</p

Koon, Daniel W.

Wang, Fei

Petersen, Dirch Hjorth

Hansen, Ole

Online Research Database In Technology

Sensitivity of resistive and Hall measurements to local inhomogeneities

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Journal of Applied Physics

http://orbit.dtu.dk/ws/files/70735679/1.4826490.pdf

Sensitivity of resistive and Hall measurements to local inhomogeneities

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