Amartaivan  Ts.

Ishii  K.

Ishizaki  A.

Kawamura  Y.

Matsuyama  S.

Momose  G.

Oyama  R.

Yamazaki  H.

Ishii, K.

Amartaivan, Ts.

Yamazaki, H.

Matsuyama, S.

Kawamura, Y.

Oyama, R.

Ishizaki, A.

Momose, G.

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Chemical State Analisis of Cr Compounds Using Heavy ion PIXE

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Chemical State Analisis of Cr Compounds UsingHeavy ion PIXE著者 Ishii  K., Amartaivan  Ts., Yamazaki  H.,Matsuyama  S., Kawamura  Y., Oyama  R.,Ishizaki  A., Momose  G.journal orpublication titleCYRIC annual reportvolume 2005page range 78-81year 2005URL http://hdl.handle.net/10097/50321CYRIC Annual Report 2005    V. 3.  Chemical State Analisis of Cr Compounds Using Heavy ion PIXE    Ishii K., Amartaivan Ts., Yamazaki H., Matsuyama S., Kawamura Y., Oyama R.,  Ishizaki A., and Momose G.  Graduate School of Engineering, Tohoku University,    Introduction The toxicity of heavier elements differs widely in their chemical state as well as there concentrations.  Therefore, trace heavy element analysis with their chemical state and high sensitivity is of great importance for environmental monitoring.  Particle induced x-ray emission (PIXE) is a powerful technique for quantitative analysis.  Usually proton beams with an energy around 3 MeV are used in PIXE offering high sensitivity1).  Since chemical shift is very small and difficult to measured with conventional Si(Li) detector, high sensitive measurement with chemical state is impossible in this condition.  The sensitivity of PIXE strongly depends on the X-ray production cross-sections, which are proportional to the square of the projectile charge2) it can be expected that the use of heavy ion beams will improve the sensitivity of the analysis considerably.  The lower limit of detection (LLD) in the PIXE analysis using 70 MeV carbon ions is improved 2-4 times compared to that using proton bombardment for heavier elements3).   Since chemical change due to chemical state of the elements will be expanded due to multiple ionization, it may be measured with a conventional Si(Li) detector.  In the last report, the three parameters, the relative change of an intensity ratio of kβ and kα (Intensity Ratio), a ratio of kβ and kα line width (line width ratio) and an energy difference between k and kα line (relative energy shift), were measured using 70 MeV carbon ions and 3 MeV protons. Changes in those parameters were corresponds to their chemical state.  It shows that PIXE with heavy ions will lead to chemical state analysis with high-sensitivity.  Here, the Ar ion beams of 78 MeV are applied to chemical state analysis using PIXE.  Probability of multiple ionization for Ar ion beams of 78 MeV is higher than that for C ion beams of 70 MeV, which will increase sensitivity in determining chemical state with high sensitivity.   78Experimental Experiment for Ar ions was carried out at Cyclotron Radioisotope Center. Samples are Cr2(SO4)3, CrCl3, Cr(NO3)3, K2Cr2O7, Cr metal, CrB2, Cr2O3, CrB and CrF3･3H2O.  The targets were placed at an angle of 45° with respect to the beam direction. X-rays emitted from the target were measured at an angle of 90° with respect to the beam direction, by a Si(Li) detector.  1 mm Mylar film was placed in front of the Si(Li) detector to reduce pile-up events. The energy calibration was obtained with characteristic x-rays from a 241Am source.   Results The relative change of an intensity ratio of kβ and kα  (Intensity Ratio), a ratio of kβ and kα line width (line width ratio) and an energy difference between kβ and kα line (relative energy shift) for Ar ions is shown 3-dimentionally in Figure 1, in comparison with the results for protons and  carbon ions.  The changes of these parameters are within experimental errors except for intensity ratio in case of proton bombardment and difficult to specify chemical state of the elements.  In case of carbon and Ar ions, changes in parameters seem to correspond to chemical states. However, tendency of these parameter changes corresponds to chemical state is different for these ion bombardments.  Figure 2 shows the 3-parameters results for mixed samples which contains elements of different chemical states with different composition.  As expected the previous results in  Fig. 1, values of mixed samples on these parameters are close to the values of the sample in single chemical state. Since these measurements were carried out within a few minute, PIXE with Ar ions will lead to chemical state analysis with high-sensitivity.   Acknowledgements The authors thank the working group of the Cyclotron Radioisotope Center, Tohoku University for the operation and maintenance of the accelerator.    References  1) Johansson S.A.E., Campbell J.L., “PIXE A Novel Technique for Elemental Analysis”, John Wiley & Sons Ltd. (1988) 32. 2) Ishii K., Orihara., H., Iwat, Y., Bessho K., Int. J. PIXE  4 (1994) 1.  3) Amartaivan Ts., Ishii K., Yamazaki H., Matsuyama S., Suzuki A., Yamaguchi T., Abe S., Inomata K., Watanabe Y., Proceedings of 10th  international conference on PIXE and its applications, Portoroz, Slovenia, June 4-8, 2004.   79 Figure 1.  The relative change of an intensity ratio of k and k(Intensity Ratio), a ratio of k and kline width (line width ratio) and an energy difference between k and k line (relative energy shift) for proton, carbon  and Ar ions.  -0.08-0.06-0.04-0.0200.020.04-8-6-4-20246-0.1-0.0500.05rel. energy shift (eV)line width rat ioc)00.0050.010.0150.020.025-2-10123-0.0200.020.040.060.08Kb/Ka intensity ratiorel. energy shift (eV)line width ratioa)Cr metalCrB2Cr2O3CrBCrF3 3H2OCr acetateCr metalCrB2Cr2O3CrBCrF3 3H2OCr acetate-0.03-0.025-0.02-0.015-0.01-0.0050-50-40-30-20-1001020-0.2-0.15-0.1-0.050rel. energy shift (eV) Kb/Ka intensity ratioline  width r atiob)Kb/Ka intensity ratio 80  Figure 2.  Relative changes of the 3 parameters of mixed samples for proton and Ar ions.    0.02-0.06-0.05-0.04-0.03-0.02-0.0100.01-7-6-5-4-3-2-10-0.01-0.00500.0050.010.015Kb/Ka intensity ratioline width rati orel. energy shift (eV)protonargonCr metalCrB2Cr2O3MIX1MIX2 81

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Chemical State Analisis of Cr Compounds Using Heavy ion PIXE

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