Diagnosis of Spatial Resolution for Microbeam Scanning PIXE using STIM Method and CR-39 Track Detector in PASTA

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Publication date
1 January 2004
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Abstract

In PIXE analysis system and Tandem Accelerator facility ( PASTA ) of NIRS, we are using Scanning Transmission Ion Microscopy (STIM) method and solid track detector to diagnose the spatial resolution of scanning microbeam PIXE analysis system. These methods are widely used by many microbeam facilities

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    National Institute of Radiological Science: NIRS-Repository / 放射線医学総合研究所 学術機関リポジトリ

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    Last time updated on 30/10/2019