GIACHELLO G.

OMINI M.

SPARAVIGNA A.

STRIGAZZI A.

English

SPARAVIGNA, Amelia Carolina

STRIGAZZI, Alfredo

PORTO@iris (Publications Open Repository TOrino - Politecnico di Torino)

05 August 2020POLITECNICO DI TORINORepository ISTITUZIONALEHigh- sensitivity capacitance method for measuring thermal diffusivity and thermal expansion: results on aluminum andcopper / SPARAVIGNA A.; GIACHELLO G.; OMINI M.; STRIGAZZI A.. - In: INTERNATIONAL JOURNAL OFTHERMOPHYSICS. - ISSN 0195-928X. - 11(1990), pp. 1111-1111.OriginalHigh- sensitivity capacitance method for measuring thermal diffusivity and thermal expansion: results onaluminum and copperPublisher:PublishedDOI:Terms of use:openAccessPublisher copyright(Article begins on next page)This article is made available under terms and conditions as specified in the  corresponding bibliographic description inthe repositoryAvailability:This version is available at: 11583/1405989 since:Athens Authentication PointWelcome! To use the personalized features of this site, please log in or register. If you have forgotten your username or password, we can help. My SpringerLink Marked ItemsAlerts Order History Saved Items All Favorites High-sensitivity capacitance method for measuring thermal diffusivity and thermal expansion: Results on aluminum and copper Journal International Journal of ThermophysicsPublisher Springer NetherlandsISSN 0195-928X (Print) 1572-9567 (Online)Issue Volume 11, Number 6 / November, 1990DOI 10.1007/BF00500564Pages 1111-1126Subject Collection Physics and AstronomySpringerLink Date Monday, December 06, 2004Add to marked itemsAdd to shopping cartAdd to saved itemsRequest PermissionsRecommend this articleA. Sparavigna1, G. Giachello1, M. Omini1 and A. Strigazzi1Received: 13 November 1989  Abstract  Thermal diffusivity and thermal expansion in high-conducting solids can be measured by means of a capacitance method, which turns out to be simple, reliable, and accurate and yields the first property with an accuracy of 1% and the second one with an accuracy of 2%. Preliminary results, which are consistent with the literature, have been obtained on pure aluminum (99.999%) and on commercial copper, both at near room temperature.Key words  capacitance method - thermal diffusivity - thermal expansionReferences secured to subscribers.(1) Dipartimento di Fisica and I.N.F.M., Politecnico di Torino, Corso Duca degli Abruzzi 24, 10129 Torino, ItalyFind more options .. . GoWithin all contentWithin this journalWithin this issueExport this article Export this article as RIS | Text  Text PDF The size of this document is 700 kilobytes. Although it may be a lengthier download, this is the most authoritative online format.Open: Entire documentReferenced by 3 newer articles1.2.3.Content Types Subject Collections Rotter, M. (1998) A miniature capacitance dilatometer for thermal expansion and magnetostriction. Review of Scientific Instruments 69(7)[CrossRef]Sparavigna, A. (1992) Thermal diffusivity and conductivity in low-conducting materials: A new technique. International Journal of Thermophysics 13(2)[CrossRef]Omini, M. (1992) Thermal diffusivity of solids with a low expansion coefficient: A dilatometric technique. International Journal of Thermophysics 13(4)[CrossRef]Pagina 1 di 2SpringerLink - Journal Article30/08/2007http://www.springerlink.com/content/w75111584n677xw5/Measurement servicesThermal Conductivity / Diffusivity / CTE / CP measurement services www.tprl.comAluminum PropertiesMatWeb, the free materials database Datasheets for many aluminum gradeswww.matweb.comCIM Marketing CoursesInnovative Online Study Programmes Expert Support, Proven Results! www.marketingknowledge.co.ukTensile Testing MachinesTesting from 1N to 100kN, and more, and a history of superior support www.TiniusOlsen.comSlide Bearing PlatesTeflon, graphite & bronze plates & pads for high or low temperatureswww.pipingtech.comFrequently asked questions | General information on journals and books | Send us your feedback | Impressum © Springer. Part of Springer Science+Business Media Privacy, Disclaimer, Terms and Conditions, © Copyright Information Remote Address: 82.60.138.180 • Server: mpweb19HTTP User Agent: Mozilla/4.0 (compatible; MSIE 7.0; Windows NT 5.1; .NET CLR 2.0.50727)Pagina 2 di 2SpringerLink - Journal Article30/08/2007http://www.springerlink.com/content/w75111584n677xw5/

High- sensitivity capacitance method for measuring thermal diffusivity and thermal expansion: results on aluminum and copper

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High- sensitivity capacitance method for measuring thermal diffusivity and thermal expansion: results on aluminum and copper

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