We report the fabrication and the characterization of carbon fibre tips for
their use in combined scanning tunnelling and force microscopy based on
piezoelectric quartz tuning fork force sensors. We find that the use of carbon
fibre tips results in a minimum impact on the dynamics of quartz tuning fork
force sensors yielding a high quality factor and consequently a high force
gradient sensitivity. This high force sensitivity in combination with high
electrical conductivity and oxidation resistance of carbon fibre tips make them
very convenient for combined and simultaneous scanning tunnelling microscopy
and atomic force microscopy measurements. Interestingly, these tips are quite
robust against occasionally occurring tip crashes. An electrochemical
fabrication procedure to etch the tips is presented that produces a sub-100 nm
apex radius in a reproducible way which can yield high resolution images.Comment: 14 pages, 10 figure