Differential circuits are becoming increasingly important in radio frequency (RF) and microwave applications. This has led to the development of mixed-mode scattering parameters to address differential and common-mode operations. Mixed-mode scattering parameters also address the conversion between the two modes of operation.
In the measurement or in the modeling of any differential circuits, it is found that a pure-mode network-analyzer provides accurate measurements of differential circuits. Additionally, given the standard S-parameters (either by measurements or by modeling), we can apply a conversion from standard S-parameters to mixed-mode S-parameters.
Furthermore, to guarantee the accuracy of the S-parameters derived from the measurement by the network analyzer, a proper calibration method and an appropriate type of system error model must be carefully considered. In this thesis, several different normal calibration standards, including TRL, TRL*, TRM and TRM*, and their related error models are analyzed.
Single-ended and mixed-mode S-parameters can be further processed to generate time domain eye patterns, so as to characterize signal loss and attenuation through RF devices and interconnects. The method of eye pattern generation is discussed and some samples of eye patterns for different high data-rate transmissions are presented.
Another part of the thesis details the modeling of frequency-dependent losses on transmission lines. A methodology for extracting the dielectric constant and loss tangent of the PCB substrate is demonstrated using stripline test structures. Some works on transmission line characterization and cross-section analysis are also discussed --Abstract, page iii
