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Low-Frequency Noise in InGaZnO Thin-Film Transistors with Al2O3 Gate Dielectric
Authors
Yu-Chieh Chien
Jan Genoe
+5 more
Sebastian Haesler
Luis Hoffman
Manoj Nag
Horacio Londoño Ramírez
Soeren Steudel
Publication date
23 August 2019
Publisher
ICLAB
Doi
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Abstract
Abstract is not available.
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Infoscience - École polytechnique fédérale de Lausanne
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oai:infoscience.epfl.ch:269292
Last time updated on 04/09/2019