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1/f Noise in Fully Integrated Electrolytically Gated FinFETs with Fin Width Down to 20nm
Authors
Efrain Altamirano Sanchez
Bert Du Bois
+9Â more
Emmanuel Dupuy
Anshul Gupta
Yong Kong Siew
Koen Martens
Dunja Radisic
Simone Severi
Eddy Simoen
Willem Van Roy
Anabela Veloso
Publication date
21 August 2019
Publisher
ICLAB
Doi
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Abstract
Abstract is not available.
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Infoscience - École polytechnique fédérale de Lausanne
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Last time updated on 04/09/2019