It is known that all resolution IV regular 2n−m designs of run size
N=2n−m where 5N/16<n<N/2 must be projections of the maximal even design
with N/2 factors and, therefore, are even designs. This paper derives a
general and explicit relationship between the wordlength pattern of any even
2n−m design and that of its complement in the maximal even design. Using
these identities, we identify some (weak) minimum aberration 2n−m designs
of resolution IV and the structures of their complementary designs. Based on
these results, several families of minimum aberration 2n−m designs of
resolution IV are constructed.Comment: Published in at http://dx.doi.org/10.1214/08-AOS670 the Annals of
Statistics (http://www.imstat.org/aos/) by the Institute of Mathematical
Statistics (http://www.imstat.org