X-RAY AND AUGER-ELECTRON YIELDS FOR QUANTITATIVE ELEMENT ANALYSIS

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Publication date
1 January 1987
Publisher
'American Vacuum Society'
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    Abstract

    JITSCHIN W, Werner U. X-RAY AND AUGER-ELECTRON YIELDS FOR QUANTITATIVE ELEMENT ANALYSIS. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS. 1987;5(4):1203-1205

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