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X-RAY AND AUGER-ELECTRON YIELDS FOR QUANTITATIVE ELEMENT ANALYSIS
Authors
W JITSCHIN
Udo Werner
Publication date
1 January 1987
Publisher
'American Vacuum Society'
Doi
Cite
Abstract
JITSCHIN W, Werner U. X-RAY AND AUGER-ELECTRON YIELDS FOR QUANTITATIVE ELEMENT ANALYSIS. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS. 1987;5(4):1203-1205
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info:doi/10.1116%2F1.574640
Last time updated on 23/04/2021
Publications at Bielefeld University
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oai:pub.uni-bielefeld.de:16552...
Last time updated on 05/09/2013