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Recrystallization and investigation of bismuth thin films by means of electron beam in transmission electron microscope
Authors
V. Y. Kolosov
L. M. Veretennikov
A. A. Yushkov
Publication date
1 January 2018
Publisher
'IOP Publishing'
Doi
Abstract
Thin bismuth films obtained by vacuum deposition were recrystallized under electron beam of scanning electron microscope at 5 kV and examined in a transmission electron microscope at 200 kV. In recrystallized films, various microstructures were detected: single-crystal, polycrystalline and amorphous regions, more or less faceted grains, single crystals and untransparent drop-shaped particles. In the crystallized film, a strong internal bending of the crystal lattice is detected, up to 110 deg/μm. © Published under licence by IOP Publishing Ltd.Partial support of project 3.6121.2017/8.9 (The Ministry of Education and Science of the Russian Federation) and Agreement No 02.A03.21.0006 (Act 211 Government of the Russian Federation) is acknowledged
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Institutional repository of Ural Federal University named after the first President of Russia B.N.Yeltsin
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Last time updated on 21/08/2019