Gupta, Jay A.

Hollen, Shawna M.

Johnston-Halperin, Ezekiel

Santagata, N M

Young, Justin R.

English

UNH Scholars' Repository

University of New HampshireUniversity of New Hampshire Scholars' RepositoryPhysics Scholarship Physics3-2013Towards in situ correlation of atomic structure anddevice functionality in graphene-based devicesShawna M. HollenUniversity of New Hampshire - Main CampusN M. SantagataOhio State University - Main CampusJustin R. YoungUniversity of New Hampshire - Main Campus, Justin.Young@unh.eduJay A. GuptaOhio State University - Main CampusEzekiel Johnston-HalperinOhio State University - Main CampusFollow this and additional works at: https://scholars.unh.edu/physics_facpubPart of the Physics CommonsThis Conference Proceeding is brought to you for free and open access by the Physics at University of New Hampshire Scholars' Repository. It has beenaccepted for inclusion in Physics Scholarship by an authorized administrator of University of New Hampshire Scholars' Repository. For moreinformation, please contact nicole.hentz@unh.edu.Recommended Citationhttp://meetings.aps.org/link/BAPS.2013.MAR.A7.12Abstract Submittedfor the MAR13 Meeting ofThe American Physical SocietyTowards in situ correlation of atomic structure and device func-tionality in graphene-based devices S. M. HOLLEN, NANCY SANTA-GATA, JUSTIN YOUNG, JAY GUPTA, EZEKIEL JOHNSTON-HALPERIN, OhioState University, CENTER FOR EMERGENT MATERIALS TEAM | The useof scanned probe microscopy to study atomic-scale phenomena is well established;however, there is a gap in our understanding of how atomistic studies connect tomacroscopic measurements such as electron and spin transport. This gap is of par-ticular importance to 2D materials such as graphene, germanane and MoS2 due tothe extreme sensitivity to defects, adatoms, and local electronic inhomogeneities.We present work towards the integration of low temperature scanning tunneling mi-croscopy (STM) with in situ transport measurements on nanoscale graphene devicesin ultrahigh vacuum. Challenges we are addressing include (i) fabricating devicessmall enough that a sucient fraction of the surface can be modied within thesmall scan range typical of STM, (ii) design of alignment electrodes for locating thedevices with STM, and (iii) modication of the STM hardware to integrate electrontransport measurements. We anticipate that being able to correlate device transportmeasurements with atomic scale characterization and modication of the graphenesurface will allow us to address the importance of the local environment to devicefunctionality.Shawna HollenOhio State UniversityDate submitted: 09 Nov 2012 Electronic form version 1.4

Towards in situ correlation of atomic structure and device functionality in graphene-based devices

University of New Hampshire

University of New Hampshire
University of New Hampshire Scholars' Repository
Physics Scholarship Physics
3-2013
Towards in situ correlation of atomic structure and
device functionality in graphene-based devices
Shawna M. Hollen
University of New Hampshire - Main Campus
N M. Santagata
Ohio State University - Main Campus
Justin R. Young
University of New Hampshire - Main Campus, Justin.Young@unh.edu
Jay A. Gupta
Ohio State University - Main Campus
Ezekiel Johnston-Halperin
Ohio State University - Main Campus
Follow this and additional works at: https://scholars.unh.edu/physics_facpub
Part of the Physics Commons
This Conference Proceeding is brought to you for free and open access by the Physics at University of New Hampshire Scholars' Repository. It has been
accepted for inclusion in Physics Scholarship by an authorized administrator of University of New Hampshire Scholars' Repository. For more
information, please contact nicole.hentz@unh.edu.
Recommended Citation
http://meetings.aps.org/link/BAPS.2013.MAR.A7.12
Abstract Submitted
for the MAR13 Meeting of
The American Physical Society
Towards in situ correlation of atomic structure and device func-
tionality in graphene-based devices S. M. HOLLEN, NANCY SANTA-
GATA, JUSTIN YOUNG, JAY GUPTA, EZEKIEL JOHNSTON-HALPERIN, Ohio
State University, CENTER FOR EMERGENT MATERIALS TEAM — The use
of scanned probe microscopy to study atomic-scale phenomena is well established;
however, there is a gap in our understanding of how atomistic studies connect to
macroscopic measurements such as electron and spin transport. This gap is of par-
ticular importance to 2D materials such as graphene, germanane and MoS2 due to
the extreme sensitivity to defects, adatoms, and local electronic inhomogeneities.
We present work towards the integration of low temperature scanning tunneling mi-
croscopy (STM) with in situ transport measurements on nanoscale graphene devices
in ultrahigh vacuum. Challenges we are addressing include (i) fabricating devices
small enough that a sufficient fraction of the surface can be modified within the
small scan range typical of STM, (ii) design of alignment electrodes for locating the
devices with STM, and (iii) modification of the STM hardware to integrate electron
transport measurements. We anticipate that being able to correlate device transport
measurements with atomic scale characterization and modification of the graphene
surface will allow us to address the importance of the local environment to device
functionality.
Shawna Hollen
Ohio State University
Date submitted: 09 Nov 2012 Electronic form version 1.4


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Towards in situ correlation of atomic structure and device functionality in graphene-based devices

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