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High Resolution Alpha Particle Detection Using 4H–SiC Epitaxial Layers: Fabrication, Characterization, and Noise Analysis
Authors
S. K. Chaudhuri
K. C. Mandal
K. J. Zavalla
Publication date
11 November 2013
Publisher
Scholar Commons
Abstract
Abstract is not available.
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Last time updated on 09/07/2019
