The mass spectrometric analyses o f xenon fluorides prepared by Slivnik
et al.1 were carried out with a, modi faed Nier type mass spectrometer as described by Furman and Vrscaj2. The resolving power of the instrument was adjusted a·t about 200 which was sufficient for the present purpose

D. Vrščaj

J. Marsel

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CR 0 AT IC A CHEM I CA ACT A 34 (1962) 191 DOPISI LETTERS -CCA-264 546.295 :546.16 :543.51 Mass Spectrometric Measurements of Xenon Fluorides To the Editor: The mass spectrometric analyses of xenon fluorides prepared by Slivnik et al.1 were carried out with a,modifaed Nier type mass spectrometer as descri-bed by Furman and Vrscaj2. The resolving power of the instrument was adjusted a·t about 200 which was sufficient for the present purpose. Samples of xenon fluoride of about 100 mg. were :introduced at room temperature into the ion source through a ga1siinlet system similar to the one used for the analyses of uranium hexafluoride3• Several hours after intrn-duction of the xenon fluol'lide vapor the peak intensities of xenon isotopes more then 100 times greater then the corresponding peaks of XeF+ were observed. The effect can be attributed to the reatCtlion of xenon fluoride with CuO in the gas-inl·et system and to the decomposihcm in the ion source. The peak-height rntio Xe+/XeF+ decreasses to 5:1 after 48 hours of continuous introduction of the sample 1iinto the mass spectrometer. Further work in this II I\ II · I Fig. 1 192 J. MARSEL AND V. VRSCAJ fie1d is needed to explain the observed effects i•n the m ass spectrometric identification of x enon fluorides. The ma.ss spectrum of xenon fluorides was scanned by varying the accelerating voltage amd p h otographed on the CRT. The complete m ass spectrum of x enon flu or ides is presented illl Fd.gures 1 and 2. \\'I ~ . * \ l l l ll ll\\l \l\\\ llll l/' l ... IL/ I it' -w•~ Fig. 2 The ion masses in Fig. 3. observed irn the m ass ra1nge hiigher than XeF4 may be attributed to the presence of XeOF/, XeOF,: , XeOF/ or higher xenon fluorides up to XeF8 • The measurements which are in progress in our labo-ratory would probably g:ive the answer about the presence of these ion m asses formed under the reported conditions of synthes'is of xenon fluo!'ides1• As reported by Chernick et al.4 the presence of xenon oxyfluorides and xenon fluorides up to XeOF/ respectively XeF/, was proposed. The peak he.ights of some xenon oxyfluorides are changed by the back-ground spect rum . X ENON FLUORIDES 19~ Fig. 3 Ljubljana, Novembe,r 13, 1962. J. MARSEL AND V. VRSCAJ »Jozef Stefan« Institute for Nuclear Researc1 Ljubljana, Slovenia, Yug 01slavia REFERENCES 1. J. S 1 iv n i k et aL, Croat. Chem. Acta 34 (1962) 187. 2. L. Fu rm a n and V. V rs ca j , Reports J. Stefan Inst. 4 (1957) J 09. 3. L. D e b eve c et aL, RepO(rts J. Stefan Inst . 5 (1958) 33. 4. C. L . Chern i ck, H . H . C 1 a as s en, P . R. Fi e 1 d s, H. H . Hyman, J . G. Malm,. W. M. Manning, Mj. S. M a thes o n, L.A. Quarterm.an, F . Schrein e r , H . H. Selig, I. Shen. S. S iegel, E. N. Sloth, L. Stein, M . H. Studi er, J. L . Week s, and M. H. Z ir in, Science 138 (1962) 136. IZVOD DOPISA Mjerenja na ksenonovu fluoridu spektrografom mase J. Marsei i v. Vrseaj Pdkazani su spektrogrami mase dobiveni na uzorku XeF,1• Maksimumi u po-d rucju iznad polofaja za masu XeF4 pripisuju se ne samo olrnifluor idima, vec i viSim fluoridima, do XeF8• INSTITUT »JOZEF STEFAN« LJUBLJANA Primljeno 13. studenog 1962. 

Mass Spectrometric Measurements of Xenon Fluorides

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