A flexible method for the preparation of thin film samples for in situ TEM characterization combining shadow-FIB milling and electron beam-assisted etching

Authors
Publication date
1 December 2016
Publisher
'Elsevier BV'
Doi

    Abstract

    Abstract is not available.

      Similar works

      Full text

      thumbnail-image

      Available Versions

      Crossref

      redirect
      oaiinfo:doi/10.1016%2Fj.ultramic....
      Last time updated on 10/01/2021

      MPG.PuRe

      redirect
      oaioai:pure.mpg.de:item_3016220
      Last time updated on 15/06/2019