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Obstacle strength of binary junction due to dislocation dipole formation: An in-situ transmission electron microscopy study
Authors
S. Haghighat
R. Schäublin
Publication date
1 October 2015
Publisher
'Elsevier BV'
Doi
Cite
Abstract
Abstract is not available.
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MPG.PuRe
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oai:escidoc.org:escidoc:218114...
Last time updated on 23/08/2016
MPG.PuRe
See this paper in CORE
Go to the repository landing page
Download from data provider
oai:pure.mpg.de:item_2181142
Last time updated on 15/06/2019