A. Abboud

Abboud

Andritschke

Busing

C. Kirchlechner

Chung

Davey

Fano

Fleck

Haque

J. Keckes

J. S. Micha

Kapp

Kiener

L. Strüder

Ledbetter

Levine

Moser

O. Ulrich

Petit

R. Hartmann

S. Send

Send

Soltau

Strüder

Stölken

T. Conka Nurdan

U. Pietsch

Uchic

Ulrich

Yumoto

English

The full strain and stress tensor determination in a triaxially stressed single crystal using X-ray diffraction requires a series of lattice spacing measurements at different crystal orientations. This can be achieved using a tunable X-ray source. This article reports on a novel experimental procedure for single-shot full strain tensor determination using polychromatic synchrotron radiation with an energy range from 5 to 23 keV. Microbeam X-ray Laue diffraction patterns were collected from a copper micro-bending beam along the central axis (centroid of the cross section). Taking advantage of a two-dimensional energy-dispersive X-ray detector (pnCCD), the position and energy of the collected Laue spots were measured for multiple positions on the sample, allowing the measurement of variations in the local microstructure. At the same time, both the deviatoric and hydrostatic components of the elastic strain and stress tensors were calculated.</jats:p

Crossref

Journal of Applied Crystallography

Single-shot full strain tensor determination with microbeam X-ray Laue diffraction and a two-dimensional energy-dispersive detector

http://journals.iucr.org/j/issues/2017/03/00/ks5549/ks5549.pdf

Single-shot full strain tensor determination with microbeam X-ray Laue diffraction and a two-dimensional energy-dispersive detector

Abstract

Similar works

Full text

Available Versions

Crossref