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Magnetic Force Microscopy (MFM) probes by FEBID and their application
Authors
Agustina Asenjo Barahona
Eider Berganza
+4 more
Miriam Jaafar
César Magén
Javier Pablo-Navarro
José María de Teresa
Publication date
31 May 2019
Publisher
Abstract
Resumen del trabajo presentado al 7th International Workshop on Focused Electron Beam-Induced (FEBIP), celebrado en Modena (Italia) del 10 al 13 de julio de 2018.Peer Reviewe
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Last time updated on 01/06/2019