Simulation of Single and Multi-Node Collection: Impact on SEU Occurrence in Nanometric SRAM Cells

Authors
Publication date
1 June 2011
Publisher
'Institute of Electrical and Electronics Engineers (IEEE)'

Abstract

International audienc

    Similar works

    Full text

    thumbnail-image

    Available Versions

    HAL AMU

    redirect
    oaioai:HAL:hal-02025253v1
    Last time updated on 23/05/2019