YBCO Yüzey Kaplanmış İletkenler İçin Sol-jel Prosesiyle Pr2O3 Buffer Katmanların Sentezlenmesi ve Karakterizasyonu

Abstract

Pr2O3 films were deposited using a sol-gel process from solutions derived from praseodymium (III) isoproxide. Homogenous, crack-free, and dense films were deposited on Ni tapes between temperatures of 600o C and 850o C for YBCO surface coated conductors. These films were characterized by XRD, SEM and AFM. According to XRD pattern, Pr2O3 film is successfully grown on Ni substrate. It was found that microstructures of the films are dense, continuous, crack-free and pinhole-free. As a result, it is accepted that Pr2O3 film is suitable for YBCO surface coated conductors

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